Zero-cost MTP high density NVM modules in a CMOS process flow

A. Atrash; G. Cassuto; W. Chen; V. Dayan; O. Galzur; M. Gutman; A. Heiman; G. Hunsinger; D. Nahmad; A. Parag; E. Pikhay; Y. Roizin; B. Smith; A. Strum; T. Tishbi; R. Teggatz

doi:10.1109/IMW.2010.5488313

Zero-cost MTP high density NVM modules in a CMOS process flow

A. Atrash^*, G. Cassuto, W. Chen, V. Dayan, O. Galzur, M. Gutman, A. Heiman, G. Hunsinger, D. Nahmad, A. Parag, E. Pikhay, Y. Roizin, B. Smith, A. Strum, T. Tishbi, R. Teggatz

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

A zero-cost embedded high density MTP NVM with extensive statistical verification is presented. The family of compact single Poly modules ranging from 64bit to 64kbit is based on the Y-Flash concept, employing original array architectures and implemented in standard and power management (PM) 0.18um CMOS process flows. No special HV devices or additional masks are employed. Excellent reliability performance allowing more than 10k program/erase cycles and 10year data retention at 150°C is demonstrated.

Original language	English
Title of host publication	2010 IEEE International Memory Workshop, IMW 2010
DOIs	https://doi.org/10.1109/IMW.2010.5488313
State	Published - 2010
Externally published	Yes
Event	2010 IEEE International Memory Workshop, IMW 2010 - Seoul, Korea, Republic of Duration: 16 May 2010 → 19 May 2010

Publication series

Name	2010 IEEE International Memory Workshop, IMW 2010

Conference

Conference	2010 IEEE International Memory Workshop, IMW 2010
Country/Territory	Korea, Republic of
City	Seoul
Period	16/05/10 → 19/05/10

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10.1109/IMW.2010.5488313

Cite this

Atrash, A., Cassuto, G., Chen, W., Dayan, V., Galzur, O., Gutman, M., Heiman, A., Hunsinger, G., Nahmad, D., Parag, A., Pikhay, E., Roizin, Y., Smith, B., Strum, A., Tishbi, T., & Teggatz, R. (2010). Zero-cost MTP high density NVM modules in a CMOS process flow. In 2010 IEEE International Memory Workshop, IMW 2010 [5488313] (2010 IEEE International Memory Workshop, IMW 2010). https://doi.org/10.1109/IMW.2010.5488313

@inproceedings{3bf8b8f32cef4c059e0b28929ce6c062,

title = "Zero-cost MTP high density NVM modules in a CMOS process flow",

abstract = "A zero-cost embedded high density MTP NVM with extensive statistical verification is presented. The family of compact single Poly modules ranging from 64bit to 64kbit is based on the Y-Flash concept, employing original array architectures and implemented in standard and power management (PM) 0.18um CMOS process flows. No special HV devices or additional masks are employed. Excellent reliability performance allowing more than 10k program/erase cycles and 10year data retention at 150°C is demonstrated.",

author = "A. Atrash and G. Cassuto and W. Chen and V. Dayan and O. Galzur and M. Gutman and A. Heiman and G. Hunsinger and D. Nahmad and A. Parag and E. Pikhay and Y. Roizin and B. Smith and A. Strum and T. Tishbi and R. Teggatz",

year = "2010",

doi = "10.1109/IMW.2010.5488313",

language = "אנגלית",

isbn = "9781424467211",

series = "2010 IEEE International Memory Workshop, IMW 2010",

booktitle = "2010 IEEE International Memory Workshop, IMW 2010",

note = "null ; Conference date: 16-05-2010 Through 19-05-2010",

}

Atrash, A, Cassuto, G, Chen, W, Dayan, V, Galzur, O, Gutman, M, Heiman, A, Hunsinger, G, Nahmad, D, Parag, A, Pikhay, E, Roizin, Y, Smith, B, Strum, A, Tishbi, T & Teggatz, R 2010, Zero-cost MTP high density NVM modules in a CMOS process flow. in 2010 IEEE International Memory Workshop, IMW 2010., 5488313, 2010 IEEE International Memory Workshop, IMW 2010, 2010 IEEE International Memory Workshop, IMW 2010, Seoul, Korea, Republic of, 16/05/10. https://doi.org/10.1109/IMW.2010.5488313

TY - GEN

T1 - Zero-cost MTP high density NVM modules in a CMOS process flow

AU - Atrash, A.

AU - Cassuto, G.

AU - Chen, W.

AU - Dayan, V.

AU - Galzur, O.

AU - Gutman, M.

AU - Heiman, A.

AU - Hunsinger, G.

AU - Nahmad, D.

AU - Parag, A.

AU - Pikhay, E.

AU - Roizin, Y.

AU - Smith, B.

AU - Strum, A.

AU - Tishbi, T.

AU - Teggatz, R.

PY - 2010

Y1 - 2010

N2 - A zero-cost embedded high density MTP NVM with extensive statistical verification is presented. The family of compact single Poly modules ranging from 64bit to 64kbit is based on the Y-Flash concept, employing original array architectures and implemented in standard and power management (PM) 0.18um CMOS process flows. No special HV devices or additional masks are employed. Excellent reliability performance allowing more than 10k program/erase cycles and 10year data retention at 150°C is demonstrated.

AB - A zero-cost embedded high density MTP NVM with extensive statistical verification is presented. The family of compact single Poly modules ranging from 64bit to 64kbit is based on the Y-Flash concept, employing original array architectures and implemented in standard and power management (PM) 0.18um CMOS process flows. No special HV devices or additional masks are employed. Excellent reliability performance allowing more than 10k program/erase cycles and 10year data retention at 150°C is demonstrated.

UR - http://www.scopus.com/inward/record.url?scp=77957929152&partnerID=8YFLogxK

U2 - 10.1109/IMW.2010.5488313

DO - 10.1109/IMW.2010.5488313

M3 - פרסום בספר כנס

AN - SCOPUS:77957929152

SN - 9781424467211

T3 - 2010 IEEE International Memory Workshop, IMW 2010

BT - 2010 IEEE International Memory Workshop, IMW 2010

Y2 - 16 May 2010 through 19 May 2010

ER -

Zero-cost MTP high density NVM modules in a CMOS process flow

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