X-ray diffraction characterization of ternary artificial superlattices

I. Goldfarb*, E. Zolotoyabko, D. Shechtman

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


Thin films of alternating Au, Ag, and Cu wedge-shaped metal layers were made by magnetron sputtering in order to develop a method for investigation of a multicomponent systems. X-ray-diffraction patterns of all as-deposited samples revealed satellites in the vicinity of (111) reflections, evidence of composition-modulated artificial superlattice formation. The experimental spectra are well explained by the kinematical diffraction theory for imperfect superlattices. Computer simulations have demonstrated extremely high sensitivity to the fluctuations ΔH/H of the superlattice period H. As a result, a rapid and simple method of ΔH/H determination is proposed.

Original languageEnglish
Pages (from-to)2501-2506
Number of pages6
JournalJournal of Applied Physics
Issue number4
StatePublished - 1993
Externally publishedYes


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