Wave interference effects in liquid phase epitaxial layers in Hg1-xCdxTe

Y. Rosenwaks; A. Sher; A. Zussman

doi:10.1016/s0040-6090(89)80019-7

Wave interference effects in liquid phase epitaxial layers in Hg_1-xCd_xTe

Y. Rosenwaks^*, A. Sher, A. Zussman

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

IR transmission and reflection spectra of Hg_1-xCd_xTe/CdTe structures grown by liquid phase epitaxy were measured. The effect of structural and compositional inhomogeneities on the interference fringe pattern is analyzed and discussed. Analysis of the effect of the interdiffusion layer on the fringe pattern was used to derive the refractive index profile and the results were correlated with Auger electron spectroscopy compositional measurements. The disappearance of the fringes is shown to indicate the presence of a rough interface.

Original language	English
Pages (from-to)	25-34
Number of pages	10
Journal	Thin Solid Films
Volume	169
Issue number	1
DOIs	https://doi.org/10.1016/s0040-6090(89)80019-7
State	Published - 1989
Externally published	Yes

Access to Document

10.1016/s0040-6090(89)80019-7

Cite this

@article{1593c78203db4887a9f0a9c125960b9b,

title = "Wave interference effects in liquid phase epitaxial layers in Hg1-xCdxTe",

abstract = "IR transmission and reflection spectra of Hg1-xCdxTe/CdTe structures grown by liquid phase epitaxy were measured. The effect of structural and compositional inhomogeneities on the interference fringe pattern is analyzed and discussed. Analysis of the effect of the interdiffusion layer on the fringe pattern was used to derive the refractive index profile and the results were correlated with Auger electron spectroscopy compositional measurements. The disappearance of the fringes is shown to indicate the presence of a rough interface.",

author = "Y. Rosenwaks and A. Sher and A. Zussman",

year = "1989",

doi = "10.1016/s0040-6090(89)80019-7",

language = "אנגלית",

volume = "169",

pages = "25--34",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier",

number = "1",

}

TY - JOUR

T1 - Wave interference effects in liquid phase epitaxial layers in Hg1-xCdxTe

AU - Rosenwaks, Y.

AU - Sher, A.

AU - Zussman, A.

PY - 1989

Y1 - 1989

N2 - IR transmission and reflection spectra of Hg1-xCdxTe/CdTe structures grown by liquid phase epitaxy were measured. The effect of structural and compositional inhomogeneities on the interference fringe pattern is analyzed and discussed. Analysis of the effect of the interdiffusion layer on the fringe pattern was used to derive the refractive index profile and the results were correlated with Auger electron spectroscopy compositional measurements. The disappearance of the fringes is shown to indicate the presence of a rough interface.

AB - IR transmission and reflection spectra of Hg1-xCdxTe/CdTe structures grown by liquid phase epitaxy were measured. The effect of structural and compositional inhomogeneities on the interference fringe pattern is analyzed and discussed. Analysis of the effect of the interdiffusion layer on the fringe pattern was used to derive the refractive index profile and the results were correlated with Auger electron spectroscopy compositional measurements. The disappearance of the fringes is shown to indicate the presence of a rough interface.

UR - http://www.scopus.com/inward/record.url?scp=0024608714&partnerID=8YFLogxK

U2 - 10.1016/s0040-6090(89)80019-7

DO - 10.1016/s0040-6090(89)80019-7

M3 - מאמר

AN - SCOPUS:0024608714

VL - 169

SP - 25

EP - 34

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

IS - 1

ER -

Wave interference effects in liquid phase epitaxial layers in Hg_1-xCd_xTe

Abstract

Access to Document

Other files and links

Fingerprint

Cite this