Abstract
IR transmission and reflection spectra of Hg1-xCdxTe/CdTe structures grown by liquid phase epitaxy were measured. The effect of structural and compositional inhomogeneities on the interference fringe pattern is analyzed and discussed. Analysis of the effect of the interdiffusion layer on the fringe pattern was used to derive the refractive index profile and the results were correlated with Auger electron spectroscopy compositional measurements. The disappearance of the fringes is shown to indicate the presence of a rough interface.
Original language | English |
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Pages (from-to) | 25-34 |
Number of pages | 10 |
Journal | Thin Solid Films |
Volume | 169 |
Issue number | 1 |
DOIs | |
State | Published - 1989 |
Externally published | Yes |