ULSI copper and silver interconnect microstructure based image enhancement algorithm

H. Duadi, Pavel Livshits*, E. Gur, A. Inberg, Y. Shacham-Diamand, A. Weiss, Z. Zalevsky

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Original languageEnglish
Title of host publicationAdvanced Metallization Conference 2010
Number of pages2
StatePublished - 2010
EventAdvanced Metallization Conference 2010 - Albany, NY, United States
Duration: 5 Oct 20107 Oct 2010

Publication series

NameAdvanced Metallization Conference (AMC)
ISSN (Print)1540-1766


ConferenceAdvanced Metallization Conference 2010
Country/TerritoryUnited States
CityAlbany, NY

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