Traps spectroscopy of the Si3Ni4 layer using localized charge-trapping nonvolatile memory device

Eli Lusky*, Yosi Shacham-Diamand, Assaf Shappir, Ilan Bloom, Boaz Eitan

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

30 Scopus citations

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Engineering

Physics