Traps spectroscopy of the Si3Ni4 layer using localized charge-trapping nonvolatile memory device

Eli Lusky*, Yosi Shacham-Diamand, Assaf Shappir, Ilan Bloom, Boaz Eitan

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

29 Scopus citations

Fingerprint

Dive into the research topics of 'Traps spectroscopy of the Si3Ni4 layer using localized charge-trapping nonvolatile memory device'. Together they form a unique fingerprint.

Keyphrases

Engineering

Physics