Transport and Charging in Single Semiconductor Nanocrystals Studied by Conductance Atomic Force Microscopy

Eyal Nahum, Yuval Ebenstein, Assaf Aharoni, Taleb Mokari, Uri Banin, Nira Shimoni, Oded Millo

Research output: Contribution to journalArticlepeer-review

Abstract

Electrical transport measurements through single InAs and CdSe semiconductor nanocrystals embedded in a thin polymer film were performed using conductance atomic force microscopy. The current and topography images showed excellent correlation, where current was detected only over the nanocrystals. A rapid current decay in consecutive scans was observed for positive sample bias, while remaining intact at negative bias. This current decay was accompanied by bias-dependent changes in the height of the nanocrystals. These phenomena, which were not observed for gold nanocrystals, are attributed to long-sustained charging of the nanocrystals.

Original languageEnglish
Pages (from-to)103-108
Number of pages6
JournalNano Letters
Volume4
Issue number1
DOIs
StatePublished - Jan 2004
Externally publishedYes

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