Threshold voltage variability of NROM memories after exposure to ionizing radiation

Domenico Corso*, Sebania Libertino, Michael Lisiansky, Yakov Roizin, Felix Palumbo, Fabio Principato, Calogero Pace, Paolo Finocchiaro, Salvatore A. Lombardo

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

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Engineering & Materials Science

Chemistry