Threshold voltage variability of NROM memories after exposure to ionizing radiation

Domenico Corso*, Sebania Libertino, Michael Lisiansky, Yakov Roizin, Felix Palumbo, Fabio Principato, Calogero Pace, Paolo Finocchiaro, Salvatore A. Lombardo

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Fingerprint

Dive into the research topics of 'Threshold voltage variability of NROM memories after exposure to ionizing radiation'. Together they form a unique fingerprint.

Keyphrases

Physics

Engineering

Immunology and Microbiology

Material Science