TY - JOUR
T1 - Three-dimensional characterization of drug-encapsulating particles using STEM detector in FEG-SEM
AU - Barkay, Zahava
AU - Rivkin, Ilia
AU - Margalit, Rimona
PY - 2009/6
Y1 - 2009/6
N2 - New drug-encapsulating particles were investigated using bright field (BF) scanning transmission electron microscopy (STEM) in a field emission gun (FEG) scanning electron microscope (SEM). Thickness characterization was done based on measuring the effective cross-section for interaction in our sample-detector configuration using calibration particles. A simplified analytical model, taking account of BF-STEM contrast and effective cross-section for interaction, was utilized for transforming projected two-dimensional BF-STEM images into three-dimensional thickness images. The three-dimensional characterization is demonstrated on a new family of biological materials composed of submicron to micron drug-free and drug-encapsulating particles. The importance of using BF-STEM in SEM, relative to other electron microscopy methods, is discussed as well as the lateral and depth resolution.
AB - New drug-encapsulating particles were investigated using bright field (BF) scanning transmission electron microscopy (STEM) in a field emission gun (FEG) scanning electron microscope (SEM). Thickness characterization was done based on measuring the effective cross-section for interaction in our sample-detector configuration using calibration particles. A simplified analytical model, taking account of BF-STEM contrast and effective cross-section for interaction, was utilized for transforming projected two-dimensional BF-STEM images into three-dimensional thickness images. The three-dimensional characterization is demonstrated on a new family of biological materials composed of submicron to micron drug-free and drug-encapsulating particles. The importance of using BF-STEM in SEM, relative to other electron microscopy methods, is discussed as well as the lateral and depth resolution.
KW - Drug-encapsulating particles
KW - Low energy STEM
KW - Mass-thickness contrast
KW - SEM
UR - http://www.scopus.com/inward/record.url?scp=63549133988&partnerID=8YFLogxK
U2 - 10.1016/j.micron.2008.12.003
DO - 10.1016/j.micron.2008.12.003
M3 - ???researchoutput.researchoutputtypes.contributiontojournal.article???
AN - SCOPUS:63549133988
SN - 0968-4328
VL - 40
SP - 480
EP - 485
JO - Micron
JF - Micron
IS - 4
ER -