Thermal fluctuations and lifetime of the nonequilibrium steady state in a hysteretic Josephson junction

The probability distribution of thermal fluctuations around the finite-voltage steady state of a hysteretic Josephson junction, as well as the transition probability out of that state, are both calculated by a simple method that promises to be applicable to a wide variety of nonequilibrium, steady-state situations. Our results are in excellent agreement with those obtained by numerical simulations. Specific experiments are suggested in order to verify the results for the Josephson junction.