Thermal fluctuations and lifetime of the nonequilibrium steady state in a hysteretic Josephson junction

E. Ben-Jacob*, D. J. Bergman, Z. Schuss

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

18 Scopus citations

Abstract

The probability distribution of thermal fluctuations around the finite-voltage steady state of a hysteretic Josephson junction, as well as the transition probability out of that state, are both calculated by a simple method that promises to be applicable to a wide variety of nonequilibrium, steady-state situations. Our results are in excellent agreement with those obtained by numerical simulations. Specific experiments are suggested in order to verify the results for the Josephson junction.

Original languageEnglish
Pages (from-to)519-522
Number of pages4
JournalPhysical Review B-Condensed Matter
Volume25
Issue number1
DOIs
StatePublished - 1982

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