A model is presented which can explain previously published experimental results of sensitization and de-sensitization of the 460 nm emission in the 110°C TL peak in synthetic quartz. The simple model presented includes one kind of recombination center and two kinds of trapping states, one directly related to the TL peak and other which acts as a competitor. Once a set of parameters is chosen, the set of simultaneous differential equations is numerically solved for the three stages of the experiment, namely, excitation, relaxation and heating in each cycle. Following the experimental procedure such repeated cycles are performed starting from either low or high initial sensitivity. For a given repeated "test dose", the sensitivity approaches the same equilibrium level, starting from either low or high values, both in the experiments and stimulated results. This agreement between the experimental and numerical results adds credibility to the competing trap model of sensitization. As opposed to the conventional pre-dose effect of the 380 nm emission, the occurence of the hole reservoir is not required for the model.