The use of cluster quality for track fitting in the CSC detector

Erez Etzion; David Primor; Giora Mikenberg; Nir Amram; Hagit Messer

doi:10.1109/NSSMIC.2006.356098

The use of cluster quality for track fitting in the CSC detector

Erez Etzion^*, David Primor, Giora Mikenberg, Nir Amram, Hagit Messer

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The new particle accelerators and its experiments create a challenging data processing environment, characterized by large amount of data where only small portion of it carry the expected new scientific information. Modern detectors, such as the Cathode Strip Chamber (CSC), achieve high accuracy of coordinate measurements (between 50 to 70 microns). However, heavy physical backgrounds can decrease the accuracy significantly. In the presence of such background, the charge induced over adjacent CSC strips (cluster) is different from the ideal Matheison distribution. The traditional least squares method which takes the same ideal position error for all clusters loses its optimal properties on contaminated data. A new technique that calculates the cluster quality and uses it to improve the track fitting results is suggested. The algorithm is applied on test beam data, and its performance is compared to other fitting methods. It is shown that the suggested algorithm improves the fitting performance significantly.

Original language	English
Title of host publication	2006 IEEE Nuclear Science Symposium - Conference Record
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1-4
Number of pages	4
ISBN (Print)	1424405610, 9781424405619
DOIs	https://doi.org/10.1109/NSSMIC.2006.356098
State	Published - 2006
Event	2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD - San Diego, CA, United States Duration: 29 Oct 2006 → 4 Nov 2006

Publication series

Name	IEEE Nuclear Science Symposium Conference Record
Volume	1
ISSN (Print)	1095-7863

Conference

Conference	2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD
Country/Territory	United States
City	San Diego, CA
Period	29/10/06 → 4/11/06

Keywords

CSC detector
Cluster quality
Track fitting

Access to Document

10.1109/NSSMIC.2006.356098

Cite this

Etzion, E., Primor, D., Mikenberg, G., Amram, N., & Messer, H. (2006). The use of cluster quality for track fitting in the CSC detector. In 2006 IEEE Nuclear Science Symposium - Conference Record (pp. 1-4). [4178937] (IEEE Nuclear Science Symposium Conference Record; Vol. 1). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NSSMIC.2006.356098

@inproceedings{e49c4b6febc941fe9212e0263b6170fe,

title = "The use of cluster quality for track fitting in the CSC detector",

abstract = "The new particle accelerators and its experiments create a challenging data processing environment, characterized by large amount of data where only small portion of it carry the expected new scientific information. Modern detectors, such as the Cathode Strip Chamber (CSC), achieve high accuracy of coordinate measurements (between 50 to 70 microns). However, heavy physical backgrounds can decrease the accuracy significantly. In the presence of such background, the charge induced over adjacent CSC strips (cluster) is different from the ideal Matheison distribution. The traditional least squares method which takes the same ideal position error for all clusters loses its optimal properties on contaminated data. A new technique that calculates the cluster quality and uses it to improve the track fitting results is suggested. The algorithm is applied on test beam data, and its performance is compared to other fitting methods. It is shown that the suggested algorithm improves the fitting performance significantly.",

keywords = "CSC detector, Cluster quality, Track fitting",

author = "Erez Etzion and David Primor and Giora Mikenberg and Nir Amram and Hagit Messer",

year = "2006",

doi = "10.1109/NSSMIC.2006.356098",

language = "אנגלית",

isbn = "1424405610",

series = "IEEE Nuclear Science Symposium Conference Record",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "1--4",

booktitle = "2006 IEEE Nuclear Science Symposium - Conference Record",

address = "ארצות הברית",

note = "null ; Conference date: 29-10-2006 Through 04-11-2006",

}

Etzion, E, Primor, D, Mikenberg, G, Amram, N & Messer, H 2006, The use of cluster quality for track fitting in the CSC detector. in 2006 IEEE Nuclear Science Symposium - Conference Record., 4178937, IEEE Nuclear Science Symposium Conference Record, vol. 1, Institute of Electrical and Electronics Engineers Inc., pp. 1-4, 2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD, San Diego, CA, United States, 29/10/06. https://doi.org/10.1109/NSSMIC.2006.356098

The use of cluster quality for track fitting in the CSC detector. / Etzion, Erez; Primor, David; Mikenberg, Giora et al.

2006 IEEE Nuclear Science Symposium - Conference Record. Institute of Electrical and Electronics Engineers Inc., 2006. p. 1-4 4178937 (IEEE Nuclear Science Symposium Conference Record; Vol. 1).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - The use of cluster quality for track fitting in the CSC detector

AU - Etzion, Erez

AU - Primor, David

AU - Mikenberg, Giora

AU - Amram, Nir

AU - Messer, Hagit

PY - 2006

Y1 - 2006

N2 - The new particle accelerators and its experiments create a challenging data processing environment, characterized by large amount of data where only small portion of it carry the expected new scientific information. Modern detectors, such as the Cathode Strip Chamber (CSC), achieve high accuracy of coordinate measurements (between 50 to 70 microns). However, heavy physical backgrounds can decrease the accuracy significantly. In the presence of such background, the charge induced over adjacent CSC strips (cluster) is different from the ideal Matheison distribution. The traditional least squares method which takes the same ideal position error for all clusters loses its optimal properties on contaminated data. A new technique that calculates the cluster quality and uses it to improve the track fitting results is suggested. The algorithm is applied on test beam data, and its performance is compared to other fitting methods. It is shown that the suggested algorithm improves the fitting performance significantly.

AB - The new particle accelerators and its experiments create a challenging data processing environment, characterized by large amount of data where only small portion of it carry the expected new scientific information. Modern detectors, such as the Cathode Strip Chamber (CSC), achieve high accuracy of coordinate measurements (between 50 to 70 microns). However, heavy physical backgrounds can decrease the accuracy significantly. In the presence of such background, the charge induced over adjacent CSC strips (cluster) is different from the ideal Matheison distribution. The traditional least squares method which takes the same ideal position error for all clusters loses its optimal properties on contaminated data. A new technique that calculates the cluster quality and uses it to improve the track fitting results is suggested. The algorithm is applied on test beam data, and its performance is compared to other fitting methods. It is shown that the suggested algorithm improves the fitting performance significantly.

KW - CSC detector

KW - Cluster quality

KW - Track fitting

UR - http://www.scopus.com/inward/record.url?scp=38649128797&partnerID=8YFLogxK

U2 - 10.1109/NSSMIC.2006.356098

DO - 10.1109/NSSMIC.2006.356098

M3 - פרסום בספר כנס

AN - SCOPUS:38649128797

SN - 1424405610

SN - 9781424405619

T3 - IEEE Nuclear Science Symposium Conference Record

SP - 1

EP - 4

BT - 2006 IEEE Nuclear Science Symposium - Conference Record

PB - Institute of Electrical and Electronics Engineers Inc.

Y2 - 29 October 2006 through 4 November 2006

ER -

The use of cluster quality for track fitting in the CSC detector

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