The use of cluster quality for track fitting in the CSC detector

Erez Etzion*, David Primor, Giora Mikenberg, Nir Amram, Hagit Messer

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The new particle accelerators and its experiments create a challenging data processing environment, characterized by large amount of data where only small portion of it carry the expected new scientific information. Modern detectors, such as the Cathode Strip Chamber (CSC), achieve high accuracy of coordinate measurements (between 50 to 70 microns). However, heavy physical backgrounds can decrease the accuracy significantly. In the presence of such background, the charge induced over adjacent CSC strips (cluster) is different from the ideal Matheison distribution. The traditional least squares method which takes the same ideal position error for all clusters loses its optimal properties on contaminated data. A new technique that calculates the cluster quality and uses it to improve the track fitting results is suggested. The algorithm is applied on test beam data, and its performance is compared to other fitting methods. It is shown that the suggested algorithm improves the fitting performance significantly.

Original languageEnglish
Title of host publication2006 IEEE Nuclear Science Symposium - Conference Record
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-4
Number of pages4
ISBN (Print)1424405610, 9781424405619
DOIs
StatePublished - 2006
Event2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD - San Diego, CA, United States
Duration: 29 Oct 20064 Nov 2006

Publication series

NameIEEE Nuclear Science Symposium Conference Record
Volume1
ISSN (Print)1095-7863

Conference

Conference2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD
Country/TerritoryUnited States
CitySan Diego, CA
Period29/10/064/11/06

Keywords

  • CSC detector
  • Cluster quality
  • Track fitting

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