The stochastic test collection problem: Models, exact and heuristic solution approaches

Yifat Douek-Pinkovich, Irad Ben-Gal, Tal Raviv*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Fingerprint

Dive into the research topics of 'The stochastic test collection problem: Models, exact and heuristic solution approaches'. Together they form a unique fingerprint.

Keyphrases

Computer Science

Engineering

Mathematics