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The Self-adjusting File (SAF). Part 3: Removal of Debris and Smear Layer-A Scanning Electron Microscope Study
Zvi Metzger*, Ehud Teperovich, Raphaela Cohen, Raviv Zary, Frank Paqué, Michael Hülsmann
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review