The role of the cantilever in Kelvin probe force: Microscopy measurements

George Elias, Thilo Glatzel, Ernst Meyer, Alex Schwarzman, Amir Boag, Yossi Rosenwaks

Research output: Contribution to journalArticlepeer-review

Abstract

The role of the cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever. The calculations show that the cantilever has a very strong effect on the absolute value of the measured contact potential difference even under ultra-high vacuum conditions, and we demonstrate a good agreement between our model and KPFM measurements in ultra-high vacuum of NaCl monolayers grown on Cu(111). The effect of the oscillating cantilever shape on the KPFM resolution and sensitivity has been calculated and found to be relatively small.

Original languageEnglish
Pages (from-to)252-260
Number of pages9
JournalBeilstein Journal of Nanotechnology
Volume2
Issue number1
DOIs
StatePublished - 2011

Keywords

  • Boundary elements method
  • Cantilever
  • Convolution
  • Kelvin probe force microscopy
  • Point spread function

Fingerprint

Dive into the research topics of 'The role of the cantilever in Kelvin probe force: Microscopy measurements'. Together they form a unique fingerprint.

Cite this