The palomar transient factory photometric calibration

E. O. Ofek, R. Laher, N. Law, J. Surace, D. Levitan, B. Sesar, A. Horesh, D. Poznanski, J. C. Van Eyken, S. R. Kulkarni, P. Nugent, J. Zolkower, R. Walters, M. Sullivan, M. Agüeros, L. Bildsten, J. Bloom, S. B. Cenko, A. Gal-Yam, C. GrillmairG. Helou, M. M. Kasliwal, R. Quimby

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