The Mott insulators at extreme conditions; Structural consequences of pressure-induced electronic transitions

Gregory Kh Rozenberg*, Weiming Xu, Moshe P. Pasternak

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

15 Scopus citations

Abstract

Electronic/magnetic transitions and their structural consequences in Fe-based Mott insulators in a regime of very high static density are the main issue of this short review paper. The paper focuses on the above-mentioned topics based primarily on our previous and ongoing experimental HP studies employing: (i) diamond anvil cells, (ii) synchrotron X-ray diffraction, (iii) 57Fe Mössbauer spectroscopy, (iv) electrical resistance and (v) X-ray absorption spectroscopy. It is shown that applying pressure to such strongly correlated systems leads to a number of changes; including quenching of the orbital moment, quenching of Jahn-Teller distortion, spin crossover, inter-valence charge transfer, insulator-metal transition, moment collapse and volume collapse. These changes may occur simultaneously or sequentially over a range of pressures. Any of these may be accompanied by or be a consequence of a structural phase transition; namely, a change in crystal symmetry. Analyzing this rich variety of phenomena we show the main scenarios which such strongly correlated systems may undergo on the way to a correlation breakdown (Mott transition). To illustrate these scenarios we present recent results for MFeO3 (M = Fe, Ga, Lu, Eu, Pr) and CaFe2O4 ferric oxides; FeCl2 and FeI2 ferrous halides, and FeCr2S4 sulfide. Fe3O4 is given as an example case for the impact of Mössbauer Spectroscopy on High Pressure Crystallography studies.

Original languageEnglish
Pages (from-to)210-222
Number of pages13
JournalZeitschfrift fur Kristallographie
Volume229
Issue number3
DOIs
StatePublished - Mar 2014

Funding

FundersFunder number
Israeli Science Foundation789/10

    Keywords

    • Electronic transitions
    • High pressure
    • Mott insulators
    • X-ray crystallography

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