TY - JOUR
T1 - The future of industrial statistics
T2 - A panel discussion
AU - Steinberg, David M.
AU - Bisgaard, Søren
AU - Fisher, Nicholas
AU - Hahn, Gerald
AU - Kettenring, Jon
AU - Montgomery, Douglas C.
AU - Doganaksoy, Necip
AU - Gunter, Bert
AU - Keller-Mc nulty, Sallie
AU - Meeker, William Q.
AU - Wu, C. F.Jeff
N1 - Funding Information:
Acknowledgments. The author is grateful to Michele Mosca for encouraging him to write up this note. F.S. would like to thank the anonymous reviewers for valuable comments and John Schank for joyful discussions on lattice-based signature schemes. F.S. acknowledges support from Ontario Research Fund, Industry Canada and Cryp-toWorks21.
PY - 2008/1/1
Y1 - 2008/1/1
N2 - Technometrics was founded in 1959 as a forum for publishing statistical methods and applications in engineering and the physical and chemical sciences. The expanding role of statistics in industry was a major stimulus, and, throughout the years many articles in the journal have been motivated by industrial problems. In this panel discussion we look ahead to the future of industrial statistics. Ten experts, encompassing a range of backgrounds, experience, and expertise, answered my request to share with us their thoughts on what lies ahead in industrial statistics. Short biographical sketches of the panelists are provided at the end of the discussion. The panelists wrote independent essays, which I have combined into an integrated discussion. Most of the essays were written as responses to a list of 10 questions that I provided to help the participants direct their thoughts. I have organized the discussion in that same fashion, stating the questions and then providing the related responses. Several discussants added remarks on the role of statistics journals, particularly of Technometrics, and I have added that as a final question. We see this article, not as the end of the story, but rather as the takeoff point for further discussion. To that end, we are initiating an open discussion forum; to participate, go to http://www.asq.org/pub/techno/ and click on Networking and Events. The American Society for Quality will host the forum and Bert Gunter has graciously agreed to serve as moderator.
AB - Technometrics was founded in 1959 as a forum for publishing statistical methods and applications in engineering and the physical and chemical sciences. The expanding role of statistics in industry was a major stimulus, and, throughout the years many articles in the journal have been motivated by industrial problems. In this panel discussion we look ahead to the future of industrial statistics. Ten experts, encompassing a range of backgrounds, experience, and expertise, answered my request to share with us their thoughts on what lies ahead in industrial statistics. Short biographical sketches of the panelists are provided at the end of the discussion. The panelists wrote independent essays, which I have combined into an integrated discussion. Most of the essays were written as responses to a list of 10 questions that I provided to help the participants direct their thoughts. I have organized the discussion in that same fashion, stating the questions and then providing the related responses. Several discussants added remarks on the role of statistics journals, particularly of Technometrics, and I have added that as a final question. We see this article, not as the end of the story, but rather as the takeoff point for further discussion. To that end, we are initiating an open discussion forum; to participate, go to http://www.asq.org/pub/techno/ and click on Networking and Events. The American Society for Quality will host the forum and Bert Gunter has graciously agreed to serve as moderator.
KW - Computer models
KW - Design of experiments
KW - Financial statistics
KW - Industrial research groups
KW - Information technology
KW - Innovation
KW - Massive data sets
KW - Process improvement
KW - Quality
KW - Quality management
KW - Reliability
KW - Six Sigma
UR - http://www.scopus.com/inward/record.url?scp=64549146936&partnerID=8YFLogxK
U2 - 10.1198/004017008000000136
DO - 10.1198/004017008000000136
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AN - SCOPUS:64549146936
SN - 0040-1706
VL - 50
SP - 103
EP - 127
JO - Technometrics
JF - Technometrics
IS - 2
ER -
