@inproceedings{a71ac570f0334917b4becd547bbf79d3,
title = "The evolution and analysis of electrical percolation threshold in nanometer scale thin seed layer deposited by electroless plating",
author = "V. Sabayev and N. Croitoru and A. Inberg and Y. Shacham-Diamand",
year = "2010",
language = "אנגלית",
isbn = "9781617822810",
series = "Advanced Metallization Conference (AMC)",
pages = "25--26",
booktitle = "Advanced Metallization Conference 2010",
note = "Advanced Metallization Conference 2010 ; Conference date: 05-10-2010 Through 07-10-2010",
}