Keyphrases
Deposition Conditions
100%
Substrate Temperature
100%
Filtered Vacuum Arc
100%
Heated Substrate
100%
SnO2 Thin Films
100%
ZnO-SnO2
100%
Film Characteristics
100%
Atomic Force Microscopy
33%
Deposited Film
33%
Surface Roughness
33%
Room Temperature
33%
Root Mean Square
33%
Resistivity
33%
Refractive Index
33%
Spectrophotometer
33%
Non-conductive Material
33%
Low Resistivity
33%
Diffraction
33%
Optical Constants
33%
Energy Dispersive X-ray Spectroscopy
33%
Optical Band Gap
33%
X-ray Diffraction (XRD) Analysis
33%
Extinction Coefficient
33%
Optical Transmission
33%
Index Coefficients
33%
Atomic Force Microscopy Image
33%
Source Code Analysis
33%
Depositional System
33%
Variable Angle Spectroscopic Ellipsometry
33%
Analysis Code
33%
Average Grain Size
33%
Filtered Vacuum Arc Deposition
33%
Weakly Conducting
33%
Engineering
Thin Films
100%
Deposition Condition
100%
Substrate Temperature
100%
Deposited Film
100%
Atomic Force Microscopy
66%
Ray Diffraction
66%
Energy Engineering
33%
Refractive Index
33%
Room Temperature
33%
Energy Gap
33%
Root Mean Square
33%
Deposition System
33%
Optical Transmission
33%
Analysis Code
33%
Average Grain Size
33%
Extinction Coefficient
33%
Physics
Atomic Force Microscopy
100%
Thin Films
100%
Refractivity
50%
Grain Size
50%
Room Temperature
50%
Spectrophotometer
50%
Surface Roughness
50%
Ellipsometry
50%
Material Science
Film
100%
Thin Films
100%
ZnO
100%
Electrical Resistivity
25%
Amorphous Material
12%
Surface Roughness
12%
Refractive Index
12%
Grain Size
12%
Atomic Spectroscopy
12%