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The Bispectrum of Sampled Data: Part I—detection of the Sampling Jitter
Ilan Sharfer,
Hagit Messer
School of Electrical Engineering
University of Michigan, Ann Arbor
Research output
:
Contribution to journal
›
Article
›
peer-review
19
Scopus citations
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Dive into the research topics of 'The Bispectrum of Sampled Data: Part I—detection of the Sampling Jitter'. Together they form a unique fingerprint.
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Mathematics
Random Variable
100%
Variance
100%
Triangle
100%
Power Spectra
100%
Skewness
100%
Proper Subset
100%
Keyphrases
Bispectrum
100%
Sampling Jitter
100%
Data Part
100%
Jitter
50%
Timing Error
33%
Power Spectrum
16%
Third Order
16%
Observation Time
16%
Skewness
16%
Bandlimited Signals
16%
Jitter Variance
16%
Higher Order Spectra
16%
Identically Distributed Random Variables
16%
Third-order Spectrum
16%
Stationary Signal
16%
Second Order Spectra
16%
Engineering
Sampled Data
100%
Data Part
100%
Power Spectra
33%
Observation Time
33%
Random Variable ξ
33%
Proper Subset
33%