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Testing Eulerianity and connectivity in directed sparse graphs
Yaron Orenstein,
Dana Ron
*
*
Corresponding author for this work
School of Electrical Engineering
Tel Aviv University
Research output
:
Contribution to journal
›
Article
›
peer-review
11
Scopus citations
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Keyphrases
Testing Algorithm
100%
Sparse Graphs
100%
Directed Graph
85%
Property Testing
57%
Bounded Degree
42%
K-edge-connected
42%
Undirected Graph
42%
Vertex Connectivity
42%
Decision Problems
14%
Distance Measure
14%
Number of Vertices
14%
Sublinear Time
14%
Bounded Degree Graphs
14%
Testing Problem
14%
Distance Parameter
14%
Graph Connectivity
14%
Systems Science
14%
Maximum Degree
14%
System Complexity
14%
Automata
14%
Mathematics
Property Testing
100%
Sparse Graphs
100%
Edge-Connectivity
60%
Testing Problem
20%
Maximum Degree
20%
Computer Science
Directed Graphs
100%
Vertex Connectivity
33%
Decision Problem
11%
Testing Problem
11%
Automaton
11%
Distance Measure
11%