Supply signal fluctuations due to chip power grid resonance - A new reliability concern

M. Gurfinkel, P. Livshits, A. Rozen, Y. Fefer, J. B. Bernstein, Yoram Shapira

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Original languageEnglish
Title of host publication46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS
Pages721-722
Number of pages2
DOIs
StatePublished - 2008
Event46th Annual 2008 IEEE International Reliability Physics Symposium, IRPS - Phoenix, AZ, United States
Duration: 27 Apr 20081 May 2008

Publication series

NameIEEE International Reliability Physics Symposium Proceedings
ISSN (Print)1541-7026

Conference

Conference46th Annual 2008 IEEE International Reliability Physics Symposium, IRPS
Country/TerritoryUnited States
CityPhoenix, AZ
Period27/04/081/05/08

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