Study of leakage-induced photon emission processes in sub-90 nm CMOS devices

Y. Weizman*, M. Gurfinkel, A. Margulis, Y. Fefer, Y. Shapira, E. Baruch

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Fingerprint

Dive into the research topics of 'Study of leakage-induced photon emission processes in sub-90 nm CMOS devices'. Together they form a unique fingerprint.

Keyphrases

Engineering

Physics

Material Science