Study of leakage-induced photon emission processes in sub-90 nm CMOS devices

Y. Weizman, M. Gurfinkel, A. Margulis, Y. Fefer, Y. Shapira, E. Baruch

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Original languageEnglish
Title of host publication2005 International Semiconductor Device Research Symposium
Pages44-45
Number of pages2
StatePublished - 2005
Event2005 International Semiconductor Device Research Symposium - Bethesda, MD, United States
Duration: 7 Dec 20059 Dec 2005

Publication series

Name2005 International Semiconductor Device Research Symposium
Volume2005

Conference

Conference2005 International Semiconductor Device Research Symposium
Country/TerritoryUnited States
CityBethesda, MD
Period7/12/059/12/05

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