Studies on the relation between the diffusion process and optical properties in Ti-diffused planar optical waveguides

R. Dahan, N. Croitoru, S. Ruschin

Research output: Contribution to journalArticlepeer-review

Abstract

The kinetics of Ti diffusion into Y-cut LiNb03 was investigated. Scanning electron microscopy and Auger electron spectroscopy techniques were used to study the diffusion process, while end-fire and prism coupling of light at different wavelengths was used for optical characterization. A Gaussian profile was chosen as a solution to the diffusion equation, and the diffusion constant and the activation energy for this profile were found. By comparison of the result of optical measurements with numerical theoretical calculations, we obtained an empirical relation between the initial Ti thickness and the extraordinary refractive-index change.

Original languageEnglish
Pages (from-to)4396-4401
Number of pages6
JournalApplied Optics
Volume30
Issue number30
DOIs
StatePublished - 20 Oct 1991

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