Studies of phase segregation in Cd1-xZnxTe using surface photovoltage spectroscopy

Y. Zidon; Jihua Yang; Yoram Shapira

doi:10.1063/1.1493230

Studies of phase segregation in Cd_1-xZn_xTe using surface photovoltage spectroscopy

Y. Zidon, Jihua Yang, Yoram Shapira

Department of Electrical Engineering - Physical Eng.

Research output: Contribution to journal › Article › peer-review

Abstract

Cd_1-xZn_xTe wafers used for x-ray detector arrays have been failure analyzed using x-ray diffraction, x-ray electron spectroscopy (XPS), energy dispersive spectroscopy (EDS), and surface photovoltage spectroscopy (SPS). The last shows ZnTe segregation in failed pixels while the precipitant phase is too small to be observed by the other techniques. The Zn concentration, measured using EDS and XPS, was higher than that deduced from SPS data, confirming the conclusion. The segregation can be revealed only by SPS since it is sensitive to the electronic structure and thus to x in each phase while the other techniques average x over their measurement volume.

Original language	English
Pages (from-to)	436-438
Number of pages	3
Journal	Applied Physics Letters
Volume	81
Issue number	3
DOIs	https://doi.org/10.1063/1.1493230
State	Published - 15 Jul 2002

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abstract = "Cd1-xZnxTe wafers used for x-ray detector arrays have been failure analyzed using x-ray diffraction, x-ray electron spectroscopy (XPS), energy dispersive spectroscopy (EDS), and surface photovoltage spectroscopy (SPS). The last shows ZnTe segregation in failed pixels while the precipitant phase is too small to be observed by the other techniques. The Zn concentration, measured using EDS and XPS, was higher than that deduced from SPS data, confirming the conclusion. The segregation can be revealed only by SPS since it is sensitive to the electronic structure and thus to x in each phase while the other techniques average x over their measurement volume.",

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year = "2002",

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doi = "10.1063/1.1493230",

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journal = "Applied Physics Letters",

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AU - Shapira, Yoram

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Y1 - 2002/7/15

N2 - Cd1-xZnxTe wafers used for x-ray detector arrays have been failure analyzed using x-ray diffraction, x-ray electron spectroscopy (XPS), energy dispersive spectroscopy (EDS), and surface photovoltage spectroscopy (SPS). The last shows ZnTe segregation in failed pixels while the precipitant phase is too small to be observed by the other techniques. The Zn concentration, measured using EDS and XPS, was higher than that deduced from SPS data, confirming the conclusion. The segregation can be revealed only by SPS since it is sensitive to the electronic structure and thus to x in each phase while the other techniques average x over their measurement volume.

AB - Cd1-xZnxTe wafers used for x-ray detector arrays have been failure analyzed using x-ray diffraction, x-ray electron spectroscopy (XPS), energy dispersive spectroscopy (EDS), and surface photovoltage spectroscopy (SPS). The last shows ZnTe segregation in failed pixels while the precipitant phase is too small to be observed by the other techniques. The Zn concentration, measured using EDS and XPS, was higher than that deduced from SPS data, confirming the conclusion. The segregation can be revealed only by SPS since it is sensitive to the electronic structure and thus to x in each phase while the other techniques average x over their measurement volume.

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Studies of phase segregation in Cd_1-xZn_xTe using surface photovoltage spectroscopy

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