Studies of CaF2-CdSe interfaces using UV and X-ray photoemission spectroscopy and Auger electron spectroscopy

Yoram Shapira*, C. F. Brucker, L. J. Brillson

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

We investigated overlayers of CaF2 deposited in ultrahigh vacuum onto CdSe surfaces using UV and X-ray photoemission spectroscopy and Auger electron spectroscopy. The interfaces exhibit very little reaction or interdiffusion and are remarkably abrupt. The results are compared with metal-CdSe interfaces and possible applications are discussed.

Original languageEnglish
Pages (from-to)203-210
Number of pages8
JournalThin Solid Films
Volume135
Issue number2
DOIs
StatePublished - 15 Jan 1986
Externally publishedYes

Funding

FundersFunder number
U.S. Officeo f Naval Researchu00014-80-077

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