Structural and Electrical Characterization of Indium Telluride Nano-Contacts on CdZnTe(110) Using Ultra High Vacuum Scanning Tunneling Microscopy

Universiṭat Tel-Aviv

Structural and Electrical Characterization of Indium Telluride Nano-Contacts on CdZnTe(110) Using Ultra High Vacuum Scanning Tunneling Microscopy

Universiṭat Tel-Aviv

Department of Materials Science and Engineering

Research output: Book/Report › Book

Original language	English
Place of Publication	[Tel-Aviv]
Publisher	Tel Aviv University Department of Materials Science and Engineering
Number of pages	118
State	Published - 2016

Keywords

Scanning tunneling microscopy
Semiconductors
Nanotechnology

Cite this

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title = "Structural and Electrical Characterization of Indium Telluride Nano-Contacts on CdZnTe(110) Using Ultra High Vacuum Scanning Tunneling Microscopy",

keywords = "Scanning tunneling microscopy, Semiconductors, Nanotechnology",

author = "{Universi{\d t}at Tel-Aviv} and {Cohen Taguri}, Gili and Ilan Goldfarb",

note = "Includes bibliographical references",

year = "2016",

language = "אנגלית",

publisher = "Tel Aviv University Department of Materials Science and Engineering",

}

TY - BOOK

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AU - Cohen Taguri, Gili

AU - Goldfarb, Ilan

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PY - 2016

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KW - Nanotechnology

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BT - Structural and Electrical Characterization of Indium Telluride Nano-Contacts on CdZnTe(110) Using Ultra High Vacuum Scanning Tunneling Microscopy

PB - Tel Aviv University Department of Materials Science and Engineering

CY - [Tel-Aviv]

ER -