STM and XPS study of filtered vacuum arc deposited Sn-O films

L. Kaplan*, I. Rusman, R. L. Boxman, S. Goldsmith, M. Nathan, E. Ben-Jacob

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'STM and XPS study of filtered vacuum arc deposited Sn-O films'. Together they form a unique fingerprint.

Chemistry

Engineering & Materials Science

Physics & Astronomy