Steep dispersion engineering and opto-atomic precision metrology XI: 29 January-1 February 2018, San Francisco, California, United States

Society of Photo-optical Instrumentation Engineers, Jacob Scheuer

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Original languageEnglish
Title of host publicationProceedings of SPIE
Place of PublicationBellingham, Washington
Number of pages548
ISBN (Print)9781510615823, 1510615822
StatePublished - 2018

Publication series

NameProceedings of SPIE
VolumeVolume 10548


  • Metrology

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