@inproceedings{b758a133937d46ffa20e06488be7c781,
title = "Steep dispersion engineering and opto-atomic precision metrology XI: 29 January-1 February 2018, San Francisco, California, United States",
keywords = "Metrology",
author = "{Society of Photo-optical Instrumentation Engineers} and Shahriar, {Selim M} and Jacob Scheuer",
year = "2018",
language = "אנגלית",
isbn = "9781510615823",
series = "Proceedings of SPIE",
publisher = "SPIE",
booktitle = "Proceedings of SPIE",
address = "ארצות הברית",
}