Skip to main navigation
Skip to search
Skip to main content
Tel Aviv University Home
Update Request & User Guide (TAU staff only)
Home
Experts
Research units
Research output
Datasets
Prizes
Activities
Press/Media
Search by expertise, name or affiliation
Spectromicroscopy of tantalum oxide memristors
John Paul Strachan
*
, Gilberto Medeiros-Ribeiro
, J. Joshua Yang
, M. X. Zhang
, Feng Miao
,
Ilan Goldfarb
, Martin Holt
, Volker Rose
, R. Stanley Williams
*
Corresponding author for this work
School of Mechanical Engineering
Hewlett-Packard
Argonne National Laboratory
United States Department of Energy
Research output
:
Contribution to journal
›
Article
›
peer-review
85
Scopus citations
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Spectromicroscopy of tantalum oxide memristors'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Keyphrases
Tantalum Oxide Memristor
100%
Spectromicroscopy
100%
Unique Mechanism
50%
Low Power
50%
Ray-based
50%
Ta2O5
50%
Oxide-based
50%
Material System
50%
Nano-spectroscopy
50%
Tantalum Oxide
50%
High Endurance
50%
Memristive Devices
50%
Material Science
Tantalum Oxides
100%