@article{5656007ad55d438c92a9620d11cef84f,
title = "Spectromicroscopy of tantalum oxide memristors",
abstract = "We report experiments to measure material changes in tantalum oxide-based memristive devices. The high endurance and low power demonstrated in this material system suggests a unique mechanism for the switching, which we investigated using x-ray based spectromicroscopy and nanospectroscopy. Our study nondestructively identified a localized (<150nm diameter) Ta-rich phase surrounded by nano- or polycrystalline Ta2 O5.",
author = "Strachan, \{John Paul\} and Gilberto Medeiros-Ribeiro and Yang, \{J. Joshua\} and Zhang, \{M. X.\} and Feng Miao and Ilan Goldfarb and Martin Holt and Volker Rose and Williams, \{R. Stanley\}",
note = "Funding Information: We thank J. Borghetti, M. D. Pickett, and W. Yi for helpful discussions. Work at HP is sponsored by the U.S. Government{\textquoteright}s Nano-Enabled Technology Initiative. Use of the Advanced Photon Source and the Center for Nanoscale Materials was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357.",
year = "2011",
month = jun,
day = "13",
doi = "10.1063/1.3599589",
language = "אנגלית",
volume = "98",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics",
number = "24",
}