Spectral Interferometric Microscopy for Fast and Broadband Phase Characterization

Lior Michaeli, Danielle Ben Haim, Haim Suchowski, Tal Ellenbogen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We introduce a novel interferometric method for fast, broadband and microscopic phase characterization, based on common-path configuration. The method can be implemented by adding a simple optical relay to connect conventional microscope and imaging spectrometer.

Original languageEnglish
Title of host publication2020 Conference on Lasers and Electro-Optics, CLEO 2020 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781943580767
StatePublished - May 2020
Event2020 Conference on Lasers and Electro-Optics, CLEO 2020 - San Jose, United States
Duration: 10 May 202015 May 2020

Publication series

NameConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Volume2020-May
ISSN (Print)1092-8081

Conference

Conference2020 Conference on Lasers and Electro-Optics, CLEO 2020
Country/TerritoryUnited States
CitySan Jose
Period10/05/2015/05/20

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