Spectral interferometric microscopy for fast and broadband phase characterization

Lior Michaeli; Danielle Ben Haim; Haim Suchowski; Tal Ellenbogen

doi:10.1364/CLEO_SI.2020.SW3F.7

Spectral interferometric microscopy for fast and broadband phase characterization

Lior Michaeli^*, Danielle Ben Haim, Haim Suchowski, Tal Ellenbogen

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We introduce a novel interferometric method for fast, broadband and microscopic phase characterization, based on common-path configuration. The method can be implemented by adding a simple optical relay to connect conventional microscope and imaging spectrometer.

Original language	English
Title of host publication	CLEO
Subtitle of host publication	Science and Innovations, CLEO_SI 2020
Publisher	Optica Publishing Group (formerly OSA)
ISBN (Print)	9781943580767
DOIs	https://doi.org/10.1364/CLEO_SI.2020.SW3F.7
State	Published - 2020
Event	CLEO: Science and Innovations, CLEO_SI 2020 - Washington, United States Duration: 10 May 2020 → 15 May 2020

Publication series

Name	Optics InfoBase Conference Papers
Volume	Part F183-CLEO-SI 2020
ISSN (Electronic)	2162-2701

Conference

Conference	CLEO: Science and Innovations, CLEO_SI 2020
Country/Territory	United States
City	Washington
Period	10/05/20 → 15/05/20

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10.1364/CLEO_SI.2020.SW3F.7

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@inproceedings{1409e998fd75411081c1a8d881c2545c,

title = "Spectral interferometric microscopy for fast and broadband phase characterization",

abstract = "We introduce a novel interferometric method for fast, broadband and microscopic phase characterization, based on common-path configuration. The method can be implemented by adding a simple optical relay to connect conventional microscope and imaging spectrometer.",

author = "Lior Michaeli and Haim, {Danielle Ben} and Haim Suchowski and Tal Ellenbogen",

note = "Publisher Copyright: {\textcopyright} OSA 2020 {\textcopyright} 2020 The Author(s); CLEO: Science and Innovations, CLEO_SI 2020 ; Conference date: 10-05-2020 Through 15-05-2020",

year = "2020",

doi = "10.1364/CLEO_SI.2020.SW3F.7",

language = "אנגלית",

isbn = "9781943580767",

series = "Optics InfoBase Conference Papers",

publisher = "Optica Publishing Group (formerly OSA)",

booktitle = "CLEO",

}

Michaeli, L, Haim, DB, Suchowski, H & Ellenbogen, T 2020, Spectral interferometric microscopy for fast and broadband phase characterization. in CLEO: Science and Innovations, CLEO_SI 2020., SW3F.7, Optics InfoBase Conference Papers, vol. Part F183-CLEO-SI 2020, Optica Publishing Group (formerly OSA), CLEO: Science and Innovations, CLEO_SI 2020, Washington, United States, 10/05/20. https://doi.org/10.1364/CLEO_SI.2020.SW3F.7

Spectral interferometric microscopy for fast and broadband phase characterization. / Michaeli, Lior; Haim, Danielle Ben; Suchowski, Haim et al.
CLEO: Science and Innovations, CLEO_SI 2020. Optica Publishing Group (formerly OSA), 2020. SW3F.7 (Optics InfoBase Conference Papers; Vol. Part F183-CLEO-SI 2020).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Spectral interferometric microscopy for fast and broadband phase characterization

AU - Michaeli, Lior

AU - Haim, Danielle Ben

AU - Suchowski, Haim

AU - Ellenbogen, Tal

PY - 2020

Y1 - 2020

N2 - We introduce a novel interferometric method for fast, broadband and microscopic phase characterization, based on common-path configuration. The method can be implemented by adding a simple optical relay to connect conventional microscope and imaging spectrometer.

AB - We introduce a novel interferometric method for fast, broadband and microscopic phase characterization, based on common-path configuration. The method can be implemented by adding a simple optical relay to connect conventional microscope and imaging spectrometer.

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DO - 10.1364/CLEO_SI.2020.SW3F.7

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AN - SCOPUS:85095428240

SN - 9781943580767

T3 - Optics InfoBase Conference Papers

BT - CLEO

PB - Optica Publishing Group (formerly OSA)

T2 - CLEO: Science and Innovations, CLEO_SI 2020

Y2 - 10 May 2020 through 15 May 2020

ER -

Spectral interferometric microscopy for fast and broadband phase characterization

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