@article{17a20847341a4293a983b07c7dc54308,
title = "Spectral characterization of nanostructured birefringent porous silicon",
abstract = "We present measurements and analysis of the reflection spectrum of white light from a highly birefringent porous silicon layer at different polarization states. We report an anomalous pattern in the spectrum of linearly polarized light at 45° with respect to the principal axes of the layer. This spectrum comprises a combination of two interference effects, namely the Fabry-Perot-type multiple-beam interference present in a simple thin film, and a two-wave interference caused by the beat of two combined orthogonally polarized waves propagating in the birefringent medium. We perform a Fourier analysis of the measured reflected spectra. This analysis furnishes a powerful tool in order to separate the two interference mechanisms and determine the degree of coherence of their superposition.",
author = "Keren Hakshur and Yuval Yifat and Amit Levin and Shlomo Ruschin",
note = "Publisher Copyright: {\textcopyright} 2015 Optical Society of America.",
year = "2015",
month = dec,
day = "20",
doi = "10.1364/AO.54.010636",
language = "אנגלית",
volume = "54",
pages = "10636--10640",
journal = "Applied Optics",
issn = "1559-128X",
publisher = "The Optical Society",
number = "36",
}