Special issue: E-MRS 2002 Symposium E : Advanced Characterization of Semiconductors: Strasbourg, France, June 18–21, 2002

European Materials Research Society

Research output: Contribution to specialist publication › Special issue

Original language	English
Pages	1-422
Volume	102
No	1-3
Specialist publication	Materials Science and Engineering B: Solid-State Materials for Advanced Technology
Publisher	Elsevier
State	Published - 15 Sep 2003

Cite this

@misc{41287379d3974648bb6ddb7e273389a5,

title = "Special issue: E-MRS 2002 Symposium E : Advanced Characterization of Semiconductors: Strasbourg, France, June 18–21, 2002",

author = "{European Materials Research Society} and Yossi Rosenwaks",

year = "2003",

month = sep,

day = "15",

language = "אנגלית",

volume = "102",

pages = "1--422",

journal = "Materials Science and Engineering B: Solid-State Materials for Advanced Technology",

issn = "0921-5107",

publisher = "Elsevier",

address = "הולנד",

}

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T1 - Special issue: E-MRS 2002 Symposium E : Advanced Characterization of Semiconductors

T2 - Strasbourg, France, June 18–21, 2002

AU - European Materials Research Society

A2 - Rosenwaks, Yossi

PY - 2003/9/15

Y1 - 2003/9/15

M3 - ???researchoutput.researchoutputtypes.contributiontoperiodical.special???

SN - 0921-5107

VL - 102

SP - 1

EP - 422

JO - Materials Science and Engineering B: Solid-State Materials for Advanced Technology

JF - Materials Science and Engineering B: Solid-State Materials for Advanced Technology

PB - Elsevier

ER -