Slow light, fast light, and opto-atomic precision metrology X: 30 January-2 February 2017, San Francisco, California, United States

SPIE (Society)

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Original languageEnglish
Title of host publicationProceedings of SPIE
Place of PublicationBellingham, Washington
ISBN (Print)1510606807, 1510606793, 9781510606791, 9781510606807
StatePublished - 2017

Publication series

NameProceedings of SPIE
VolumeVolume 10119
ISSN (Print)1996-756X


  • Quantum optics
  • Nonlinear optics

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