@inproceedings{2bf62eccd135450a88adc3711bc6a8fa,
title = "Slow Light, Fast Light, and Opto-Atomic Precision Metrology IX: 15-18 February 2016, San Francisco, California, United States",
author = "{Society of Photo-optical Instrumentation Engineers} and Shahriar, {Selim M} and Jacob Scheuer",
note = "Includes bibliographical references and author index",
year = "2016",
language = "אנגלית",
isbn = "1628419989",
series = "Proceedings of SPIE",
publisher = "SPIE",
booktitle = "Proceedings of SPIE",
address = "ארצות הברית",
}