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Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics

  • S. Gorfman*
  • , H. Simons
  • , T. Iamsasri
  • , S. Prasertpalichat
  • , D. P. Cann
  • , H. Choe
  • , U. Pietsch
  • , Y. Watier
  • , J. L. Jones
    • *Corresponding author for this work
  • University of Siegen
  • European Synchrotron Radiation Facility
  • Technical University of Denmark
  • North Carolina State University
  • Oregon State University

Research output: Contribution to journal › Article › peer-review

39 Scopus citations

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