Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics

S. Gorfman*, H. Simons, T. Iamsasri, S. Prasertpalichat, D. P. Cann, H. Choe, U. Pietsch, Y. Watier, J. L. Jones

*Corresponding author for this work

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Material Science