A simplified model of the 1/f noise in MOST based on the modified McWhorter's theory is proposed. The new method is similar to the approach suggested by G. Reimbold  but results in the explicit dependence of the noise spectrum on the voltage biases and process parameters. Furthermore, the resulting expressions are valid in all the regions of the channel inversion. The approximate solution is in agreement with a more complex charge sheet model and are consistent with the previously published experimental results on the 1/f noise.
|State||Published - 1989|
|Event||16th Conference of Electrical and Electronics Engineers in Israel, EEIS 1989 - Tel-Aviv, Israel|
Duration: 7 Mar 1989 → 9 Mar 1989
|Conference||16th Conference of Electrical and Electronics Engineers in Israel, EEIS 1989|
|Period||7/03/89 → 9/03/89|