TY - CHAP
T1 - Semiconductor Physics
T2 - Surface Photovoltage Spectroscopy of Semiconductors
AU - Kronik, L.
AU - Shapira, Y.
N1 - Publisher Copyright:
© 2021 Elsevier Ltd. All rights reserved.
PY - 2004/1/1
Y1 - 2004/1/1
N2 - Surface photovoltage spectroscopy (SPS) is a well-established contactless technique for semiconductor characterization, which relies on analyzing illumination-induced changes in the surface voltage. SPS traces its origins to the pioneering work of Brattain and Bardeen in the early 1950s, and was extended into a powerful spectroscopic tool by Gatos, Lagowski and Balestra in the early 1970s. It has been used as an extensive source of surface and bulk information on various semiconductors and semiconductor interfaces. In the following, we present the basic theory behind SPS, its experimental setup, and a range of its applications.
AB - Surface photovoltage spectroscopy (SPS) is a well-established contactless technique for semiconductor characterization, which relies on analyzing illumination-induced changes in the surface voltage. SPS traces its origins to the pioneering work of Brattain and Bardeen in the early 1950s, and was extended into a powerful spectroscopic tool by Gatos, Lagowski and Balestra in the early 1970s. It has been used as an extensive source of surface and bulk information on various semiconductors and semiconductor interfaces. In the following, we present the basic theory behind SPS, its experimental setup, and a range of its applications.
UR - http://www.scopus.com/inward/record.url?scp=85069307213&partnerID=8YFLogxK
U2 - 10.1016/B0-12-369395-0/00631-X
DO - 10.1016/B0-12-369395-0/00631-X
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AN - SCOPUS:85069307213
SN - 9780123693952
SP - 36
EP - 43
BT - Encyclopedia of Modern Optics, Five-Volume Set
PB - Elsevier Inc.
ER -