Segmentation by level sets and symmetry

Tammy Riklin-Raviv, Nahum Kiryati, Nir Sochen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Shape symmetry is an important cue for image understanding. In the absence of more detailed prior shape information, segmentation can be significantly facilitated by symmetry. However, when symmetry is distorted by perspectivity, the detection of symmetry becomes non-trivial, thus complicating symmetry-aided segmentation. We present an original approach for segmentation of symmetrical objects accommodating perspective distortion. The key idea is the use of the replicative form induced by the symmetry for challenging segmentation tasks. This is accomplished by dynamic extraction of the object boundaries, based on the image gradients, gray levels or colors, concurrently with registration of the image symmetrical counter-part (e.g. reflection) to itself. The symmetrical counterpart of the evolving object contour supports the segmentation by resolving possible ambiguities due to noise, clutter, distortion, shadows, occlusions and assimilation with the background. The symmetry constraint is integrated in a comprehensive level-set functional for segmentation that determines the evolution of the delineating contour. The proposed framework is exemplified on various images of skew-symmetrical objects and its superiority over state of the art variational segmentation techniques is demonstrated.

Original languageEnglish
Title of host publicationProceedings - 2006 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 2006
Pages1015-1022
Number of pages8
DOIs
StatePublished - 2006
Event2006 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 2006 - New York, NY, United States
Duration: 17 Jun 200622 Jun 2006

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Volume1
ISSN (Print)1063-6919

Conference

Conference2006 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 2006
Country/TerritoryUnited States
CityNew York, NY
Period17/06/0622/06/06

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