Scattering phenomenon investigation of the guiding surface of infrared waveguides for application in medicine

R. Dahan, A. Inberg, J. Dror, N. Croitoru

Research output: Contribution to journalConference articlepeer-review

Abstract

The influence of substrate material and deposition method on the surface roughness of section of hollow waveguides was examined by measuring the backscattering reflection. The iodination of silver was found as the main contributor to the surface roughness. The AgI laser thickness also affects an interference pattern.

Original languageEnglish
Pages (from-to)45-51
Number of pages7
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume2328
DOIs
StatePublished - 22 Dec 1994
EventBiomedical Optoelectronic Devices and Systems II 1994 - Lille, France
Duration: 6 Sep 199410 Sep 1994

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