TY - JOUR
T1 - Scattering phenomenon investigation of the guiding surface of infrared waveguides for application in medicine
AU - Dahan, R.
AU - Inberg, A.
AU - Dror, J.
AU - Croitoru, N.
N1 - Publisher Copyright:
© 1994 SPIE. All rights reserved.
PY - 1994/12/22
Y1 - 1994/12/22
N2 - The influence of substrate material and deposition method on the surface roughness of section of hollow waveguides was examined by measuring the backscattering reflection. The iodination of silver was found as the main contributor to the surface roughness. The AgI laser thickness also affects an interference pattern.
AB - The influence of substrate material and deposition method on the surface roughness of section of hollow waveguides was examined by measuring the backscattering reflection. The iodination of silver was found as the main contributor to the surface roughness. The AgI laser thickness also affects an interference pattern.
UR - http://www.scopus.com/inward/record.url?scp=0345444175&partnerID=8YFLogxK
U2 - 10.1117/12.197523
DO - 10.1117/12.197523
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AN - SCOPUS:0345444175
SN - 0277-786X
VL - 2328
SP - 45
EP - 51
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
T2 - Biomedical Optoelectronic Devices and Systems II 1994
Y2 - 6 September 1994 through 10 September 1994
ER -