TY - JOUR
T1 - Scattering of IR and visible radiation from hollow waveguides
AU - Dahan, R.
AU - Dror, J.
AU - Inberg, A.
AU - Croitoru, N.
N1 - Publisher Copyright:
© 1995 SPIE. All rights reserved.
PY - 1995/5/1
Y1 - 1995/5/1
N2 - The scattering phenomenon of infrared and visible radiation from hollow waveguides, made of teflon or fused silica, having Ag and AgI guiding layers, was measured by two methods; Total Integrated Scattered and Backscattering. The root means square roughness was evaluated by both methods. It was found that the roughness of the silver layer is influenced by the substrate. The AgI is the main contributor to roughness and this is a function of its preparation method.
AB - The scattering phenomenon of infrared and visible radiation from hollow waveguides, made of teflon or fused silica, having Ag and AgI guiding layers, was measured by two methods; Total Integrated Scattered and Backscattering. The root means square roughness was evaluated by both methods. It was found that the roughness of the silver layer is influenced by the substrate. The AgI is the main contributor to roughness and this is a function of its preparation method.
UR - http://www.scopus.com/inward/record.url?scp=84994892401&partnerID=8YFLogxK
U2 - 10.1117/12.208424
DO - 10.1117/12.208424
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AN - SCOPUS:84994892401
SN - 0277-786X
VL - 2396
SP - 115
EP - 119
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
T2 - Biomedical Optoelectronic Instrumentation 1995
Y2 - 1 February 1995 through 28 February 1995
ER -