The scattering phenomenon of infrared and visible radiation from hollow waveguides, made of teflon or fused silica, having Ag and AgI guiding layers, was measured by two methods; Total Integrated Scattered and Backscattering. The root means square roughness was evaluated by both methods. It was found that the roughness of the silver layer is influenced by the substrate. The AgI is the main contributor to roughness and this is a function of its preparation method.
|Number of pages||5|
|Journal||Proceedings of SPIE - The International Society for Optical Engineering|
|State||Published - 1 May 1995|
|Event||Biomedical Optoelectronic Instrumentation 1995 - San Jose, United States|
Duration: 1 Feb 1995 → 28 Feb 1995