Scattering of IR and visible radiation from hollow waveguides

R. Dahan, J. Dror, A. Inberg, N. Croitoru

Research output: Contribution to journalConference articlepeer-review

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The scattering phenomenon of infrared and visible radiation from hollow waveguides, made of teflon or fused silica, having Ag and AgI guiding layers, was measured by two methods; Total Integrated Scattered and Backscattering. The root means square roughness was evaluated by both methods. It was found that the roughness of the silver layer is influenced by the substrate. The AgI is the main contributor to roughness and this is a function of its preparation method.

Original languageEnglish
Pages (from-to)115-119
Number of pages5
JournalProceedings of SPIE - The International Society for Optical Engineering
StatePublished - 1 May 1995
EventBiomedical Optoelectronic Instrumentation 1995 - San Jose, United States
Duration: 1 Feb 199528 Feb 1995


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