Scanning probe microscopy : characterization, nanofabrication and device application of functional materials: Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002

Paula Maria Vilarinho (Editor), Yossi Rosenwaks (Editor), Angus I Kingon (Editor)

Research output: Book/ReportBookpeer-review

Abstract

As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance
Original languageEnglish
Place of PublicationDordrecht
PublisherKluwer Academic Publishers
Number of pages488
ISBN (Electronic)9781402030192
ISBN (Print)1402030193, 9781402030185, 9781402030178, 1402030185, 1402030177, 9786610263707, 6610263701
StatePublished - 2005

Publication series

NameNATO science series. Series II, Mathematics, physics, and chemistry
Volumev. 186

Keywords

  • Scanning probe microscopy
  • Materials
  • optische instrumenten
  • TECHNOLOGY & ENGINEERING
  • fysica
  • condenseren
  • interface
  • optics
  • Physics (General)
  • oppervlakten
  • surfaces
  • physics
  • nanotechnologie
  • nanotechnology
  • condensation
  • optical instruments
  • grensvlak
  • optica
  • Fysica (algemeen)

Fingerprint

Dive into the research topics of 'Scanning probe microscopy : characterization, nanofabrication and device application of functional materials: Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002'. Together they form a unique fingerprint.

Cite this