Keyphrases
Two Dimensional
100%
Heterostructure
100%
Atomic Level
100%
Two-dimensional Heterostructure
100%
Unique Properties
50%
Atomic Force Microscopy
50%
Chemical Composition
50%
Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS)
50%
Structural Information
50%
Characterization Techniques
50%
Vertical Heterostructures
50%
Micro-Raman Spectroscopy
50%
Unprecedented Level
50%
Graphene
50%
Layered Structure
50%
Characterization Tools
50%
Force-time
50%
Vertical Devices
50%
Functional Devices
50%
Chemical Information
50%
Hexagonal Boron Nitride (h-BN)
50%
Two-dimensional Atomic Crystals
50%
Physics
Atomic Force Microscopy
100%
Heterojunctions
100%
Graphene
100%
Raman Spectroscopy
100%
Secondary Ion Mass Spectrometry
100%
Chemistry
Chemistry
100%
Structure
66%
Phase Composition
33%
Atomic Force Microscopy
33%
Time-of-Flight Secondary Ion Mass Spectrometry
33%
Graphene
33%
Micro-Raman Spectroscopy
33%
Engineering
Two Dimensional
100%
Heterostructures
100%
Atomic Force Microscopy
20%
Graphene
20%
Heterojunctions
20%
Time-of-Flight
20%
Layer Structure
20%
Chemical Information
20%
Material Science
Heterojunction
100%
Secondary Ion Mass Spectrometry
20%
Graphene
20%
Micro-Raman Spectroscopy
20%