Revealing the dopant incorporation mechanisms into vapor-liquid-solid grown NWs employing nano-prope scanning auger microscopy

U. Givan; D. F. Paul; J. S. Hammond; Y. Rosenwaks; S. Christiansen; L. J. Lauhon

doi:10.1017/S1431927614012185

Revealing the dopant incorporation mechanisms into vapor-liquid-solid grown NWs employing nano-prope scanning auger microscopy

U. Givan, D. F. Paul, J. S. Hammond, Y. Rosenwaks, S. Christiansen, L. J. Lauhon

School of Electrical Engineering

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	2090-2091
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614012185
State	Published - 1 Aug 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: 3 Aug 2014 → 7 Aug 2014

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10.1017/S1431927614012185

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title = "Revealing the dopant incorporation mechanisms into vapor-liquid-solid grown NWs employing nano-prope scanning auger microscopy",

author = "U. Givan and Paul, {D. F.} and Hammond, {J. S.} and Y. Rosenwaks and S. Christiansen and Lauhon, {L. J.}",

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AU - Givan, U.

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AU - Rosenwaks, Y.

AU - Christiansen, S.

AU - Lauhon, L. J.

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T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

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Revealing the dopant incorporation mechanisms into vapor-liquid-solid grown NWs employing nano-prope scanning auger microscopy

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